| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide apparatus which assesses the life of an X-ray planar detector automatically from the temporal transition of temporal transition data of information of the fitting time of an action parameter and such an action parameter. <P>SOLUTION: When adjusting each capacity value of each integral amplifier to amplify each electrical charge which is retrieved from an X-ray planar detector and action parameter which has the gain of each amplifier to amplify output power of each integral amplifier, a pixel value which is outputted from the X-ray planar detector when an X ray is exposed and the reference level range of expected value are compared, the action parameter is determined automatically within the reference level range of the expected value from this comparison result, this determined action parameter and information of the fitting time of such an action parameter are accumulated as temporal transition data, and the life of the X-ray planar detector is assessed automatically from the temporal transition of this temporal transition data. <P>COPYRIGHT: (C)2008,JPO&INPIT |
