发明名称 PROTOCOL SEQUENCE GENERATOR
摘要 A system for generating test signals to test characteristics of input-output (IO) cells includes a memory and a processor coupled together through an integrated circuit (IC) chip. The IC chip includes a controller configured to exchange signals between the memory and the processor through IO cells of the IC chip. The IC chip further includes a protocol sequence generator for generating test signals for testing characteristics of the IO cells.
申请公布号 US2011145644(A1) 申请公布日期 2011.06.16
申请号 US20100751111 申请日期 2010.03.31
申请人 STMICROELECTRONICS PVT. LTD. 发明人 DWIVEDI ANIL K.;CHANDRA AKHILESH;KULKARNI AJAY ARUN
分类号 G06F11/263 主分类号 G06F11/263
代理机构 代理人
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