发明名称 Method of manufacturing openings in a substrate, a via in substrate, and a semiconductor device comprising such a via
摘要 The invention relates to a method of manufacturing openings in a substrate (5), the method comprising steps of: providing the substrate (5) with a masking layer (40) on a surface thereof; forming a first opening (10), a second opening (30), and a channel (20) in between the first opening (10) and the second opening (30) in the masking layer (40), the channel (20) connecting the first opening (10) with the second opening (30), the second opening (30) having an area (A2) that is larger than the area (A1) of the first opening (10); forming trenches (11, 21, 31) in the substrate (5) located at the first opening (10), the second opening (30), and at the channel (20) under masking of the masking layer (40) by means of anisotropic dry etching, and sealing off the trench (21) located at the channel (20) for forming the openings in the substrate (5). The method of the invention enables formation of a deeper first opening (10) than what is possible with the known methods. The invention further relates to a method of manufacturing a via in a substrate (5), which may be advantageously used in 3-dimensional integrated circuits.
申请公布号 US7927966(B2) 申请公布日期 2011.04.19
申请号 US20070518684 申请日期 2007.12.10
申请人 NXP B.V. 发明人 NGUYEN HOANG VIET;BENNEBROEK MARTINUS T.
分类号 H01L21/3065 主分类号 H01L21/3065
代理机构 代理人
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