发明名称 CHEMICAL MECHANICAL POLISHING PAD AND FABRICATION METHODE OF THE SAME
摘要 PURPOSE: A CMP(Chemical Mechanical Polishing) pad and a manufacturing method thereof are provided to efficiently form a hole having the diameter of a particular size on a CMP pad by selecting the laser beam wavelength and light absorbent. CONSTITUTION: The diameter of a hole to be formed on a polishing pad is determined according to the kind of CMP process and the kind of polished material(102). The appropriate wavelength band of a laser beam(106) and specific kind of the laser are determined according to the decided diameter of the hole. The light absorbent which can absorb the light of the wavelength band is determined according to the determined wavelength of the laser beam.
申请公布号 KR20110012293(A) 申请公布日期 2011.02.09
申请号 KR20090069960 申请日期 2009.07.30
申请人 INDUSTRY-UNIVERSITY COOPERATION FOUNDATION SOGANGUNIVERSITY 发明人 KIM, CHIL MIN
分类号 H01L21/304 主分类号 H01L21/304
代理机构 代理人
主权项
地址
您可能感兴趣的专利