| 摘要 |
A device (1) for sampling particle contaminants is described. It may be adapted to a multitude of closed enclosures and with it, contaminants and/or pollutants present in the atmosphere of the enclosure may be recovered at a surface. With this sampling method, it is possible to obtain specific information as regards their behavior. In particular, the sampling device (1) comprises a support (2) on which suitable substrates (6) may be positioned, with which samples may be collected. The device (1) is conformed so as to confine the taken samples until the site of the analysis in order to further increase the specificity of the measurement.
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