| 摘要 |
A disclosed device includes a simulation apparatus which simulates a shift in signal characteristics occurring in a wiring pattern formed in a printed wiring board including a first database that stores wiring pattern attribute information and wiring pattern positional information, a second database storing solid lack portion size information and solid lack portion positional information, a third database that stores shift amount information relative to positional relationships between the wiring patterns and the solid lack portions, a shift amount processing unit configured to obtain the shift amount of the signal characteristics in the wiring pattern corresponding to the wiring pattern attribute information which is input based on the wiring pattern positional information corresponding to the wiring pattern attribute information which is input, the solid lack portion positional information, the solid lack portion size information, and the shift amount information.
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