发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR SCREENING THE SAME |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor memory device which is not influenced by a defective memory cell even if micro-fabrication develops, and provides a high yield. <P>SOLUTION: A memory cell is provided with: a variable resistance film functioning as a variable resistance element; a first conductive film coming into contact with one face of the variable resistance film; a second conductive film coming into contact with the other face of the variable resistance film; and a rectifier element layer formed so as to come into contact with a lower face of the second conductive film and functioning as a rectifier element. A width of the first conductive film or the second conductive film is smaller than a width of the variable resistance film. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
申请公布号 |
JP2010225774(A) |
申请公布日期 |
2010.10.07 |
申请号 |
JP20090070371 |
申请日期 |
2009.03.23 |
申请人 |
TOSHIBA CORP |
发明人 |
KOMURA MASANORI;SATO MITSURU;MUROOKA KENICHI;KISHIDA MOTOYA |
分类号 |
H01L27/10;G11C13/00;H01L27/105 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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