发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR SCREENING THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor memory device which is not influenced by a defective memory cell even if micro-fabrication develops, and provides a high yield. <P>SOLUTION: A memory cell is provided with: a variable resistance film functioning as a variable resistance element; a first conductive film coming into contact with one face of the variable resistance film; a second conductive film coming into contact with the other face of the variable resistance film; and a rectifier element layer formed so as to come into contact with a lower face of the second conductive film and functioning as a rectifier element. A width of the first conductive film or the second conductive film is smaller than a width of the variable resistance film. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2010225774(A) 申请公布日期 2010.10.07
申请号 JP20090070371 申请日期 2009.03.23
申请人 TOSHIBA CORP 发明人 KOMURA MASANORI;SATO MITSURU;MUROOKA KENICHI;KISHIDA MOTOYA
分类号 H01L27/10;G11C13/00;H01L27/105 主分类号 H01L27/10
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