发明名称 |
MANUFACTURING METHOD OF ION IMPLANTATION GROUP III NITRIDE SEMICONDUCTOR SUBSTRATE, GROUP III NITRIDE SEMICONDUCTOR LAYER JUNCTION SUBSTRATE, AND GROUP III NITRIDE SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a manufacturing method or the like of an ion implantation group III nitride semiconductor substrate with a small warp and a group III nitride semiconductor layer junction substrate using the ion implantation group III nitride semiconductor substrate. <P>SOLUTION: This ion implantation group III nitride semiconductor substrate 20 includes an ion implantation region 20i which resides at one principal plane 20m side and is formed by a predetermined depth D from the principal plane 20, and has a thickness T of 500 μm or larger. Moreover, the manufacturing method of the group III nitride semiconductor layer junction substrate comprises steps of: injecting an ion I into the one principal plane 20m side of the group III nitride semiconductor substrate 20 with a thickness of 500 to 5 cm at a predetermined depth D from the principal plane 20m; connecting a different kind of a substrate 10 to the principal plane 20m of the group III nitride semiconductor substrate 20; and obtaining a group III nitride semiconductor layer junction substrate 1 by separating the group III nitride semiconductor substrate 20 in a region to which the ion I is injected and by forming a group III nitride semiconductor layer 20a connected to the different kind of substrate 10. <P>COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010192698(A) |
申请公布日期 |
2010.09.02 |
申请号 |
JP20090035706 |
申请日期 |
2009.02.18 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
MATSUMOTO NAOKI;YAGO AKIHIRO;MAEDA YOKO |
分类号 |
H01L21/02;H01L21/265;H01L33/32 |
主分类号 |
H01L21/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|