发明名称 METHODS FOR DETERMINING A WAVEFRONT POSITION
摘要 The present disclosure relates to methods for determining a wavefront position of a liquid on a surface of an assay test strip placing a liquid on the surface of the test strip; and acquiring one or more signals from the surface of the test strip at one or more times, comparing the one or more acquired signals to a threshold, wherein the wavefront position is a position on the surface of the test strip where a signal is greater than or less than a threshold (e.g., fixed or dynamic threshold). Such methods may be used to determine the wavefront velocity of a liquid on a surface of an assay test strip and the transit time of a liquid sample to traverse the one or more positions on the surface of the assay test strip.
申请公布号 US2010177930(A1) 申请公布日期 2010.07.15
申请号 US20090354141 申请日期 2009.01.15
申请人 ALVERIX, INC. 发明人 DYLEWSKI SCOTT
分类号 G06K9/00 主分类号 G06K9/00
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