| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To solve the problem that it is impossible to ensure reliability of verification processing in the conventional semiconductor device. <P>SOLUTION: A semiconductor device includes: a memory module 30 provided with a plurality of memory cells 34, a verify determination unit 40 that performs quality determination of read data that have been read from the memory cells 34 on the basis of the read data and an expected value prepared in advance, and a power source monitoring circuit 50 that detects fluctuations equal to or greater than a predetermined variation rate in a power source voltage VDD supplied to the memory module and outputs a power source abnormality detection signal A2. Furthermore, the verify determination unit 40 invalidates a result of the quality determination when the power source abnormality detection signal A2 indicates an abnormal state of the power source voltage VDD. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
