发明名称 PROBE UNIT AND INSPECTION APPARATUS
摘要 PURPOSE: A probe unit and an inspection apparatus are provided to apply inspection signal to all the terminals by contacting a contacting member and a terminal with a pressuring apparatus. CONSTITUTION: A probe block(24) implements an blinking inspection by contacting a plurality of probes(25) and a plurality of terminals installed on an inspected panel. A contacting apparatus closes each terminal in a process of blinking inspection by contacting each probe and each terminal. The contacting apparatus comprises a contacting member(33) and a pressuring apparatus(34).
申请公布号 KR20100059672(A) 申请公布日期 2010.06.04
申请号 KR20090087985 申请日期 2009.09.17
申请人 KABUSHIKI KAISHA NIHON MICRONICS 发明人 ANZAI MASAYUKI;MIURA KAZUYOSHI;SAITO HIROKI;OSANAI YASUAKI
分类号 G01R1/073;G01R31/02 主分类号 G01R1/073
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