发明名称 |
PROBE UNIT AND INSPECTION APPARATUS |
摘要 |
PURPOSE: A probe unit and an inspection apparatus are provided to apply inspection signal to all the terminals by contacting a contacting member and a terminal with a pressuring apparatus. CONSTITUTION: A probe block(24) implements an blinking inspection by contacting a plurality of probes(25) and a plurality of terminals installed on an inspected panel. A contacting apparatus closes each terminal in a process of blinking inspection by contacting each probe and each terminal. The contacting apparatus comprises a contacting member(33) and a pressuring apparatus(34). |
申请公布号 |
KR20100059672(A) |
申请公布日期 |
2010.06.04 |
申请号 |
KR20090087985 |
申请日期 |
2009.09.17 |
申请人 |
KABUSHIKI KAISHA NIHON MICRONICS |
发明人 |
ANZAI MASAYUKI;MIURA KAZUYOSHI;SAITO HIROKI;OSANAI YASUAKI |
分类号 |
G01R1/073;G01R31/02 |
主分类号 |
G01R1/073 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|