发明名称 |
PHASE-CHANGE RANDOM ACCESS MEMORY DEVICE |
摘要 |
<p>PURPOSE: A phase-change memory device is provided to have same voltage level as the voltage level applied to a word line by discharging a bit line before a writing operation and read-out operation. CONSTITUTION: A phase-change memory cell array(110) comprises a plurality of diode type phase-change memory cells arranged in a array pattern. A word line(WL1,WL2) is connected to a first end of a plurality of diode type phase-change memory cells. Bit lines are vertically arranged to the word lines. A bit line(BL1,BL2) is connected to the second end of a plurality of diode type phase-change memory cells. A discharge part(131,132) connects or discharges a plurality of bit lines to the discharge voltage.</p> |
申请公布号 |
KR20100054416(A) |
申请公布日期 |
2010.05.25 |
申请号 |
KR20080113342 |
申请日期 |
2008.11.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, HYE JIN;KIM, KWANG HO;MOON, YOUNG KUG;CHOI, BYUNG GIL |
分类号 |
G11C13/02;G11C7/10;G11C7/12;G11C8/08 |
主分类号 |
G11C13/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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