PICKING APPARATUS FOR A TEST HANDLER

摘要

PURPOSE: A picking device of a test handler is provided, which can shorten feeding time of a semiconductor device by controlling the pitch between pickers. CONSTITUTION: A plurality of pickers(110) are arranged in the first direction and pick a semiconductor device. An elongating member(120) draws pickers cross-neighboring to each other. A gap control unit(150) is arranged between pickers and controls gap between pickers through a width varying member.