发明名称 AN APPARATUS AND METHOD TO DIAGNOSE ABNORMAL CONDITIONS
摘要 PURPOSE: An abnormal state diagnosis device and a method thereof are provided to easily diagnose an abnormal state by quantifying a difficulty degree through the distinctiveness of a diagnosis device. CONSTITUTION: A user input arrangement part(100) standardize data including at least one abnormal symptom, an abnormal state, an occurrence frequency of the abnormal state, and a AND logic between abnormal symptoms. An abnormal symptom acquisition difficulty calculation part(110) calculates acquisition difficulty about the abnormal symptom. An abnormal symptom diagnosis importance calculation part(120) calculates an importance value about the abnormal symptom. A Boolean logic application part(130) selects the abnormal state corresponding to the abnormal symptom by applying a Boolean logic to the abnormal symptoms.
申请公布号 KR20100040500(A) 申请公布日期 2010.04.20
申请号 KR20080099640 申请日期 2008.10.10
申请人 KOREA ATOMIC ENERGY RESEARCH INSTITUTE 发明人 YANG, JOON EON;JUNG, WON DEA;KIM, JAE WHAN;PARK, JIN KYUN
分类号 G21C17/00;G05B23/00 主分类号 G21C17/00
代理机构 代理人
主权项
地址