发明名称 |
Probe of electrical measuring instrument |
摘要 |
Disclosed is a probe of an electrical measuring instrument including a handle and at least one loop antenna coupled to the handle. A plane defined by the loop antenna is oriented to face an object to be inspected, to detect electrical characteristics in the vicinity of the object. Enhanced accessibility of the probe with respect to the object to be inspected results in an improvement in the accuracy of measured electrical characteristics information and use convenience of the probe by an inspector.
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申请公布号 |
US2010073020(A1) |
申请公布日期 |
2010.03.25 |
申请号 |
US20090585490 |
申请日期 |
2009.09.16 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LIM JAE DEOK;SEOL BYONG SU;LEE JONG SUNG |
分类号 |
G01R31/02 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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