发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To achieve a complete protection of side surfaces of a silicon substrate and to prevent a low dielectric constant film from being peeled off in a method of manufacturing a semiconductor device having a low dielectric constant film wiring laminated structure part including a laminated structure of the silicon substrate, the low dielectric constant film and the wiring which are formed on the silicon substrate. <P>SOLUTION: On the upper surface of the silicon substrate 1, the low dielectric constant film wiring laminated structure part 3 including the laminated structure of the low dielectric constant film 4 and the wiring 5 is formed so that its side surfaces are substantially flush with the side surfaces of the silicon substrate 1. The circumferential side surfaces of the silicon substrate 1 and the low dielectric constant film wiring laminated structure part 3 are completely covered with a sealing film 15. Thus, in the structure, the low dielectric constant film 4 can hardly be peeled off and the side surfaces of the silicon substrate 1 can be completely protected against cracks or the like. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010062465(A) 申请公布日期 2010.03.18
申请号 JP20080228822 申请日期 2008.09.05
申请人 CASIO COMPUT CO LTD 发明人 WAKABAYASHI TAKESHI;MIHARA ICHIRO
分类号 H01L23/12;H01L21/301;H01L21/304;H01L21/3205;H01L21/768;H01L23/52;H01L23/522 主分类号 H01L23/12
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