| 摘要 |
<P>PROBLEM TO BE SOLVED: To create a substrate noise analysis netlist for performing substrate noise analysis in a short time. Ž<P>SOLUTION: This semiconductor device design support device comprises: an input part 101 inputting layout information 108, LSI design information 109, switching information 110, and a primitive library 111 or the like; an electric current waveform computation part 102 obtaining an electric current waveform in instance units; an electric current dispersion value computation part 103 obtaining an electric current dispersion value of each segment; a segment division part 104 deciding whether or not the electric current dispersion value of the segment is not less than a permitted value, and dividing the segment when the electric current dispersion value is not less than the permitted value; a macro-model creation part 105 creating a macro-model for each segment; a substrate netlist extraction part 106 extracting a substrate netlist; and a substrate noise analysis netlist creation part 107 creating the substrate noise analysis netlist from the macro-model of each segment and the substrate netlist. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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