发明名称 DISTORTION MEASURING DEVICE OF OPTICAL WAVEGUIDE MEANS
摘要 PROBLEM TO BE SOLVED: To provide a technique for measuring efficiently elongation distortion of an optical waveguide means generated by a temperature change or the like, concerning an optical waveguide means such as an optical fiber or an optical waveguide module. SOLUTION: When measuring a distortion change of an optical fiber following a temperature change, an optical fiber F1 for reference and an optical fiber F2 for a sample are mounted between first and second optical couplers 21, 22 by utilizing first and second optical connectors 23, 24. In a normal temperature state (for example, at 25°C), a position d0m (m=1-M) of a movable mirror 43 where the optical fiber F2 for the sample (the first to M-th optical fibers F21-F2m for the sample) generates interference is recorded. Then, a position d1m (m=1-M) of the movable mirror 43 at a generation time of interference when the temperature of a thermostatic bath 30 is changed is recorded. Thereafter, a length change ΔLm of the optical fiber for the sample is calculated from a position change dm (m=1-M) of the movable mirror 43, and distortion is determined from the ratio (ΔLm/Lm) to the initial optical fiber length Lm for the sample. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2009270859(A) 申请公布日期 2009.11.19
申请号 JP20080119739 申请日期 2008.05.01
申请人 YAZAKI CORP 发明人 SHISHIDO MASATAKA;FURUKAWA SHINICHI
分类号 G01B11/16;G01B9/02 主分类号 G01B11/16
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