发明名称 SEMICONDUCTOR MEMORY DEVICE JUNCTION AND METHOD OF FORMING THE SAME
摘要 The present invention relates to semiconductor memory device junction and a method of forming the same. The semiconductor memory device junction may include a semiconductor substrate having gate lines formed thereon, and a junction having first and second junction elements formed by implanting impurities of a different mass into the semiconductor substrate between the gate lines. The method of forming a semiconductor memory device junction may include providing a semiconductor substrate having gate lines, forming an auxiliary layer along a surface of the semiconductor substrate including the gate lines, implanting impurities into the semiconductor substrate between gate lines to form a first junction element, and implanting impurities into the semiconductor substrate to form a second junction element, wherein the impurities implanted to form the first junction element and the second junction element have different masses.
申请公布号 US2009179275(A1) 申请公布日期 2009.07.16
申请号 US20080131584 申请日期 2008.06.02
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SHON HYUN SOO
分类号 H01L27/088;H01L21/8234 主分类号 H01L27/088
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