METHOD AND SYSTEM FOR DETECTING DEFECT OF STRUCTURE

摘要

A defect detecting system (10) detects existence of a defect by detecting light emission of a light emitting film (1) formed on a surface of a structure (2), i.e., a detection target. The light emitting film (1) contains light emitting particles (1a). When a deformation change is generated in the structure (2) having a defect, the periphery of the defect is deformed due to stress concentration generated at the periphery, and the light emitting film on the surface is also deformed. As strain energy propagates to the light emitting particles and makes the light emitting particles emit light, the defect which cannot be visually inspected canbe indicated to the outside of the structure by emission of light. Thus, the method and the system for easily and accurately detecting the existence of the defect without destroying the structure are provided.