发明名称 Thin film germanium diode with low reverse breakdown
摘要 In fabricating an electronic structure, a substrate is provided, and a first barrier layer is provided on the substrate. A germanium thin film diode is provided on the first barrier layer, and a second barrier layer is provided on the germanium thin film diode. A memory device is provided over and connected to the second barrier layer.
申请公布号 US7468296(B1) 申请公布日期 2008.12.23
申请号 US20050290787 申请日期 2005.11.30
申请人 SPANSION LLC;ADVANCED MICRO DEVICES INC. 发明人 ADEM ERCAN;BUYNOSKI MATTHEW;CHIU ROBERT;CHOO BRYAN;GABRIEL CALVIN;JEON JOONG;MATSUMOTO DAVID;SHIELDS JEFFREY;SINGH BHANWAR;STOCKWELL WINNY;YU WEN
分类号 H01L21/8234;H01L27/10 主分类号 H01L21/8234
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