发明名称 Method for measuring the roundness of round profiles
摘要 <p>The method involves calibrating and determining a centre (Z-0) in the measuring field of the measuring device. The perpendiculars (r-1 to r-6, r-1' to r-6') from the centre to the tangents (T-1 to T-6, T-1' to T-6') and the distance from the centre to the tangents are calculated. The corner points of the polygon surrounding the spherical profile are calculated, and a contour is determined. A reference circuit is determined in relation to the contour such that the quadratic shape deviation of the contour reaches a minimum in relation to reference circuit. The reference circuit represents the smallest possible circuit that adapts to the contour, and represents the largest possible circuit that adapts to the contour. The reference circuit together with an additional circuit that is concentric to the reference circuit surrounds the contour at a minimal radial distance.</p>
申请公布号 EP1978329(A1) 申请公布日期 2008.10.08
申请号 EP20070007089 申请日期 2007.04.04
申请人 ZUMBACH ELECTRONIC AG 发明人 STUDER, URS-PETER
分类号 G01B11/24;B21B38/04;G01B11/245 主分类号 G01B11/24
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