发明名称 Techniques for Layer Transfer Processing
摘要 Techniques for the fabrication of semiconductor devices are provided. In one aspect, a layer transfer structure is provided. The layer transfer structure comprises a carrier substrate having a porous region with a tuned porosity in combination with an implanted species defining a separation plane therein. In another aspect, a method of forming a layer transfer structure is provided. In yet another aspect, a method of forming a three dimensional integrated structure is provided.
申请公布号 US2008280416(A1) 申请公布日期 2008.11.13
申请号 US20080180827 申请日期 2008.07.28
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BEDELL STEPHEN W.;FOGEL KEITH EDWARD;FURMAN BRUCE KENNETH;PURUSHOTHAMAN SAMPATH;SADANA DEVENDRA K.;TOPOL ANNA WANDA
分类号 H01L21/30;H01L21/00;H01L21/762;H01L21/822;H01L29/04 主分类号 H01L21/30
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