发明名称 NEAR-FIELD LIGHT PROBE, OPTICAL DEVICE, PROBE MICROSCOPE, AND PROBE MICROSCOPE TYPE READ/WRITE HEAD DEVICE
摘要 PROBLEM TO BE SOLVED: To acquire highly-reliable measurement result with high resolution without polluting a sample. SOLUTION: A probe 14 is formed to have a conical recessed shape, and on the inner surface of the probe 14, a metal film coat 30 is formed up to the tip of the probe 14 by metal deposition so that surface plasmon resonance occurs. In the probe 14, when information detection laser light 19 is focused onto the tip, plasmon resonance occurs on the surface of the metal film coat 30, and near-field light 31 is generated from the tip, and the sample 31 is irradiated with the near-field light 31. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008175651(A) 申请公布日期 2008.07.31
申请号 JP20070008491 申请日期 2007.01.17
申请人 GUNMA UNIV 发明人 HOSAKA SUMIO;SONE ITSUHITO
分类号 G01B11/30;G01Q20/02;G01Q60/18;G01Q60/22;G01Q80/00 主分类号 G01B11/30
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