| 摘要 |
A test system is disclosed wherein a device under test (DUT) includes a trace logic analyzer (TLA) that receives and stores test data. The test system includes both a master tester and a slave tester. The slave tester operates at a high speed data rate substantially faster than that of the master tester. The master tester instructs the TLA to monitor data that the DUT receives from the slave tester to detect a predetermined data pattern within the data. The slave tester transmits data including the predetermined data pattern to the DUT. The DUT receives the data. When the TLA in the DUT detects the predetermined data pattern in the received data, the TLA stores that data pattern as a stored data pattern. The master tester retrieves the stored data pattern and compares the stored data pattern with the original predetermined data pattern. If the master tester determines that the stored data pattern is the same as the original predetermined data pattern, then the master tester generates a pass result. Otherwise, the master tester generates a fail result. In one embodiment, the DUT includes multiple receivers and the system determines a pass/fail rating on a per receiver basis.
|
