发明名称 |
Wiring structure of a semiconductor device, method of forming the wiring structure, non-volatile memory device including the wiring structure, and method of manufacturing the non-volatile memory device |
摘要 |
A wiring structure of a semiconductor device may include an insulation interlayer on a substrate, the insulation interlayer having a linear first trench having a first width and a linear second trench having a second width, the linear second trench being in communication with a lower portion of the linear first trench, the first width being wider than the second width, and a conductive layer pattern in the linear first and second trenches.
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申请公布号 |
US2008017889(A1) |
申请公布日期 |
2008.01.24 |
申请号 |
US20070798715 |
申请日期 |
2007.05.16 |
申请人 |
KOH YOUNG-HO;CHUNG BYUNG-HONG;KIM WON-JIN;PARK HYUN;MIN JI-YOUNG |
发明人 |
KOH YOUNG-HO;CHUNG BYUNG-HONG;KIM WON-JIN;PARK HYUN;MIN JI-YOUNG |
分类号 |
H01L23/52;H01L21/44;H01L21/82;H01L27/10;H01L29/739 |
主分类号 |
H01L23/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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