发明名称 Wiring structure of a semiconductor device, method of forming the wiring structure, non-volatile memory device including the wiring structure, and method of manufacturing the non-volatile memory device
摘要 A wiring structure of a semiconductor device may include an insulation interlayer on a substrate, the insulation interlayer having a linear first trench having a first width and a linear second trench having a second width, the linear second trench being in communication with a lower portion of the linear first trench, the first width being wider than the second width, and a conductive layer pattern in the linear first and second trenches.
申请公布号 US2008017889(A1) 申请公布日期 2008.01.24
申请号 US20070798715 申请日期 2007.05.16
申请人 KOH YOUNG-HO;CHUNG BYUNG-HONG;KIM WON-JIN;PARK HYUN;MIN JI-YOUNG 发明人 KOH YOUNG-HO;CHUNG BYUNG-HONG;KIM WON-JIN;PARK HYUN;MIN JI-YOUNG
分类号 H01L23/52;H01L21/44;H01L21/82;H01L27/10;H01L29/739 主分类号 H01L23/52
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