发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device including a film formation step of heating a semiconductor substrate sucked to a susceptor, and forming a film on the heated semiconductor substrate; wherein a film with good film quality is formed on an upper surface side of the semiconductor substrate, and yield of the semiconductor substrate is improved by preventing formation of the film on a lower surface side of the substrate. SOLUTION: The susceptor 17 sucks a semiconductor substrate 22 corresponding to a first region D located inside a half of a radius R<SB>1</SB>of the semiconductor substrate 22 from the center of the substrate 22, and a semiconductor substrate 22 corresponding to a second region E located outside the first region D. A CVD film 23 is formed on the semiconductor substrate 22 heated by a heater 16 to be kept at a predetermined temperature T<SB>x</SB>. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008010500(A) 申请公布日期 2008.01.17
申请号 JP20060176970 申请日期 2006.06.27
申请人 MITSUMI ELECTRIC CO LTD 发明人 TOKI KAZUHISA;MIYAGI EISUKE
分类号 H01L21/683;C23C16/458;H01L21/205;H01L21/31;H01L21/316 主分类号 H01L21/683
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