| 摘要 |
PROBLEM TO BE SOLVED: To provide a delay time measurement method for measuring the delay time provided on the variable delay circuit in a short period of time and easily, and also to provide a delay time measurement device using the method. SOLUTION: Provided is the delay time measurement method of variable delay circuit. When the switching signal of a certain period is high level, a first delay time is set, and the output signal of the variable delay circuit is outputted to the set signal input terminal of a flip-flop, and when the switching signal is low level, a second delay time is set to the variable delay circuit, and output signal of the variable delay circuit is outputted to the input terminal of the flip-flop circuit. The voltage value of output signal of the flip-flop is measured, and from the voltage value, the difference of the first delay time and the second delay time is obtained. COPYRIGHT: (C)2008,JPO&INPIT
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