发明名称 POLISHING PAD TO PREVENT SCRATCH IN CMP PROCESS
摘要 A scratch preventing polishing pad for a chemical mechanical polishing process is provided to reduce scratch on a wafer by automatically cleaning a diamond disk during pad conditioning. A chemical mechanical polishing system includes a main body, a polishing pad(110), a head, and a polishing pad conditioner. The polishing pad has an edge with a disk cleaning section(300). The disk cleaning area removes slurry and other substances which cause scratch on a wafer, from the polishing pad conditioner. A gap(400) is formed between the disk cleaning area and the polishing pad to prevent slurry or substances removed by the disk cleaning area from entering the polishing pad.
申请公布号 KR100774824(B1) 申请公布日期 2007.11.07
申请号 KR20060125102 申请日期 2006.12.08
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 KIM, HWAL PYO
分类号 B24B37/11;B24B37/34;B24B53/017;H01L21/304 主分类号 B24B37/11
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