发明名称 |
Wafer level packaging cap and fabrication method thereof |
摘要 |
A fabrication method of a wafer level packaging cap for covering a device wafer provided with a device thereon, includes forming an insulating layer on a wafer; removing a predetermined part of the insulating layer and exposing an upper surface of the wafer; forming a cap pad extending from an upper surface and the exposed surface of the wafer; forming a cavity on a lower surface of the wafer corresponding to the cap pad; etching a bottom surface of the cavity and exposing the cap pad which is connected to the wafer through the cavity; and forming metal lines extending from the lower surface of the wafer and the cavity, to electrically connect the cap pad which is exposed through the cavity.
|
申请公布号 |
US2007164410(A1) |
申请公布日期 |
2007.07.19 |
申请号 |
US20060491086 |
申请日期 |
2006.07.24 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM YONG-SUNG;KIM WOON-BAE;JUNG KYU-DONG;LEE CHANG-SEUNG |
分类号 |
H01L23/02 |
主分类号 |
H01L23/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|