| 摘要 |
An inspection device for transistor chips is provided to effectively inspect the transistor chips of different sizes in bulk by using one inspection device having plural receiving grooves for receiving the chip. An inspection device includes a body(100) and a cover(110) opened or closed around a hinge provided on the body. The body is formed with a rectangular shape, and plural plugs(101) inserted in a socket of a counter are protruded from an outer surface of the body. The plugs are electrically connected to a terminal contact portion(103). Plural receiving grooves(102) are formed on an upper surface of the body to receive a transistor chip(1).
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