发明名称 IMPEDANCE MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To measure the impedance of an object under measurement, when a DC voltage is applied. SOLUTION: The impedance measuring apparatus comprises a signal source 2 for applying a test voltage V1 to one end of the object under measurement 8, an AC current detection section 4 which converts the current I passing through the object under measurement 8, when the test voltage V1 is applied into a voltage V2, while being connected to the other end of the object under measurement 8, and detects an AC current component Iac passing through the object under measurement 8 on the basis of the voltage V2; a voltage detection section 3 for detecting an AC voltage component V4, developed between the one end and the other end of the object under measurement 8; an arithmetic control section 6 for calculating the impedance Z of the object under measurement 8, on the basis of the AC current component Iac and the AC voltage component V4; and a current source 5 which is connected to the other end of the object under measurement 8 to pull in or discharge a DC current I1 so that at least a part of a DC current component Idc, contained in the current I passing through the object under measurement 8 when the test voltage V1 is applied, can be canceled out. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007132777(A) 申请公布日期 2007.05.31
申请号 JP20050325747 申请日期 2005.11.10
申请人 HIOKI EE CORP 发明人 WAKAMATSU HIDEAKI
分类号 G01R27/02 主分类号 G01R27/02
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