摘要 |
FIELD: measurement technology, SHF electronics. SUBSTANCE: process can be used to measure dispersion characteristics of slow-wave structures. Device for realization of process has meter of reflection factor, high- frequency measurement path, used section of regular transmission line, phase shifter and active load R<SB>l</SB> connected in series and to first output of meter 1 of reflection factor and wave-meter linked to second output of meter 1 of reflection factor. Process of determination of dispersion characteristics consists in excitation of tested transmission line 4 in specified range of frequencies by SHF oscillations from meter 1 of reflection factor via high-frequency measurement path 2 loaded with resistor R<SB>l</SB>, in measurement of frequencies f<SB>1m</SB> of minimal value of r<SB>omin1m</SB> of summary reflection factor from input of transmission line, in change of phase of load R<SB>l</SB> by phase inverter by preset value ϑ<SB>m</SB>pi, in repeat measurement of frequencies f<SB>2m</SB> of minimal value r<SB>omin2m</SB> of summary reflection factor, in determination of moderation factor n<SB>m</SB> in each subrange <EMI ID=0.344 HE=6 WI=30 TI=CHI> by known relations and in construction of characteristics by computed values n<SB>m</SB>. EFFECT: measurement of dispersion characteristics under conditions corresponding to operation mode of slow-wave structures at standard working position. 4 dwg, 2 tbl
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