发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To form an oxide layer with low metal impurity concentration on the surface of a semiconductor layer employing a chemically stable semiconductor such as silicon carbide. SOLUTION: The manufacturing method of a semiconductor element comprises a process (A) of cleaning the surface of the semiconductor layer 12 consisting of a wide band gap semiconductor using gas containing a halogen group element, and a process (B) of forming an oxide layer 14 on the surface of the semiconductor layer 12. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007053227(A) |
申请公布日期 |
2007.03.01 |
申请号 |
JP20050237183 |
申请日期 |
2005.08.18 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
YAMASHITA MASAYA;KITAHATA MAKOTO;KUSUMOTO OSAMU;TAKAHASHI KUNIMASA;UCHIDA MASAO |
分类号 |
H01L21/316;H01L21/322;H01L21/336;H01L21/822;H01L27/04;H01L29/12;H01L29/78 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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