发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To form an oxide layer with low metal impurity concentration on the surface of a semiconductor layer employing a chemically stable semiconductor such as silicon carbide. SOLUTION: The manufacturing method of a semiconductor element comprises a process (A) of cleaning the surface of the semiconductor layer 12 consisting of a wide band gap semiconductor using gas containing a halogen group element, and a process (B) of forming an oxide layer 14 on the surface of the semiconductor layer 12. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007053227(A) 申请公布日期 2007.03.01
申请号 JP20050237183 申请日期 2005.08.18
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 YAMASHITA MASAYA;KITAHATA MAKOTO;KUSUMOTO OSAMU;TAKAHASHI KUNIMASA;UCHIDA MASAO
分类号 H01L21/316;H01L21/322;H01L21/336;H01L21/822;H01L27/04;H01L29/12;H01L29/78 主分类号 H01L21/316
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