发明名称 Semiconductor structures formed on substrates and methods of manufacturing the same
摘要 Processes used to transfer semiconductor structures from an initial substrate to a base substrate include bonding the initial substrate with a silicon dioxide layer to a doped silicon structure weakened sufficiently by hydrogen implantation for cleaving. After cleaving, a doped silicon layer remains, burying the silicon dioxide layer between the doped silicon layer and the initial substrate. Semiconductor structures are formed within/on an epitaxial layer disposed on the doped silicon layer forming an intermediate semiconductor structure. A process handle is temporarily bonded to the semiconductor structures for support. The initial substrate is thinned and removed by a mechanical thinning process followed by chemical etching using the buried silicon dioxide layer as an etch stop. The silicon dioxide layer is chemically removed from the doped silicon layer. A base substrate is formed on the doped silicon layer. The process handle is removed leaving the semiconductor structures disposed on the base substrate.
申请公布号 US2007020884(A1) 申请公布日期 2007.01.25
申请号 US20050189163 申请日期 2005.07.25
申请人 WANG QI;LI MINHUA;RICE JEFFREY H 发明人 WANG QI;LI MINHUA;RICE JEFFREY H.
分类号 H01L21/30;H01L21/46 主分类号 H01L21/30
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