发明名称 Method and apparatus for testing a memory device
摘要 The extension sector enable signal RS_SEL is a test target control signal for switching a test target between ordinary sectors and redundant sectors. During the test period of redundant sectors, if the defective redundant sector signal RSECF is at a HIGH level (that is, the selected redundant sector is a defective sector), the compulsory signal FMATCH is brought to a HIGH level. The match signal MATCH is forcedly brought to a HIGH level (S 22 ) in compliance with the compulsory signal FMATCH which is at a HIGH level (S 21 :T). And, verification (S 2 a) is skipped for the defective sectors, whereby the address signal for identifying the ordinary memory blocks may be utilized for identification of redundant memory blocks.
申请公布号 US2006242490(A1) 申请公布日期 2006.10.26
申请号 US20060362318 申请日期 2006.02.23
申请人 SUITOU KATSUTOSHI;NAKAYA YOSHICHIKA 发明人 SUITOU KATSUTOSHI;NAKAYA YOSHICHIKA
分类号 G11C29/00 主分类号 G11C29/00
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