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发明名称
Test pattern in flash memory device
摘要
申请公布号
KR100624915(B1)
申请公布日期
2006.09.18
申请号
KR20040001647
申请日期
2004.01.09
申请人
发明人
分类号
H01L27/115
主分类号
H01L27/115
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代理人
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