发明名称 Integrated circuit having a device wafer with a diffused doped backside layer
摘要 Integrated circuits, semiconductor devices and methods for making the same are described. Each embodiment shows a diffused, doped backside layer in a device wafer that is oxide bonded to a handle wafer. The diffused layer may originate in the device handle, in the handle wafer, in the bond oxide or in an additional semiconductor layer of polysilicon or epitaxial silicon. The methods use a thermal bond oxide or a combination of a thermal and deposited oxide.
申请公布号 US2006009007(A1) 申请公布日期 2006.01.12
申请号 US20050227389 申请日期 2005.09.15
申请人 INTERSIL AMERICAS INC. 发明人 CZAGAS JOSEPH A.;WOODBURY DUSTIN A.;BEASOM JAMES D.
分类号 H01L21/22;H01L21/30;H01L21/02;H01L21/18;H01L21/20;H01L21/225;H01L21/265;H01L21/336;H01L21/46;H01L21/74;H01L21/762;H01L27/12;H01L29/06;H01L29/10;H01L29/78 主分类号 H01L21/22
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