发明名称 Method of fabricating semiconductor by nitrogen doping of silicon film
摘要 A method of fabricating a semiconductor uses chemical vapor deposition, or plasma-enhanced chemical vapor deposition, to deposit an amorphous silicon film on an exposed surface of a substrate, such as ASIC wafer. The amorphous silicon film is doped with nitrogen to reduce the conductivity of the film and/or to augment the breakdown voltage of the film. Nitrogen gas, N<SUB>2</SUB>, is activated or ionized in a reactor before it is deposited on the substrate.
申请公布号 US2005233553(A1) 申请公布日期 2005.10.20
申请号 US20050097445 申请日期 2005.04.04
申请人 KOUNTZ MICHAEL;ENGLE GEORGE;EVERS STEVEN 发明人 KOUNTZ MICHAEL;ENGLE GEORGE;EVERS STEVEN
分类号 C23C16/24;C23C16/34;H01L21/205;H01L21/365;(IPC1-7):H01L21/365 主分类号 C23C16/24
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