发明名称 Verfahren zum Bilden einer Verbindungsleitung
摘要 A method of forming an interconnection line of a semiconductor device includes the steps of forming an insulating layer on a substrate, forming a contact hole in the insulating layer, forming a first conductive material layer in the contact hole so that a top surface level of the first conductive material layer is the same as or higher than a top surface level of the insulating layer and so that a portion of the first conductive material layer remains on the insulating layer, and forming a second conductive material layer on the first conductive material layer as the portion of the first conductive material layer remaining on the insulating layer is removed.
申请公布号 DE19723096(B4) 申请公布日期 2005.09.29
申请号 DE1997123096 申请日期 1997.06.02
申请人 LG SEMICON CO. LTD., CHEONGJU 发明人 JUN, YOUNG-KWON
分类号 H01L21/3213;H01L21/3205;H01L21/768;H01L23/52;H01L23/522;(IPC1-7):H01L21/768 主分类号 H01L21/3213
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