发明名称 PLASMA PROCESSING METHOD AND APPARATUS
摘要 In the present plasma processing method, a certain process gas is supplied into a plasma production chamber (10) in which a substrate to be processed (W) is placed, and the process gas is changed into a plasma. A certain plasma process is then conducted on the substrate (W) with this plasma. By independently controlling the spatial distribution of the plasma density and the spatial distribution of the density of radicals in the plasma in relation to the substrate (W) using an opposed portion (34) facing to the substrate (W), a certain processing state can be attained along the entire surface of the substrate (W) to be processed.
申请公布号 KR20050086831(A) 申请公布日期 2005.08.30
申请号 KR20057009444 申请日期 2005.05.25
申请人 TOKYO ELECTRON LIMITED 发明人 KOSHIISHI AKIRA;HIROSE JUN;OGASAWARA MASAHIRO;HIRANO TAICHI;SASAKI HIROMITSU;YOSHIDA TETSUO;SAITO MICHISHIGE;ISHIHARA HIROYUKI;OOYABU JUN;NUMATA KOHJI
分类号 H05H1/46;B08B7/00;C23F4/00;H01J37/32;H01L21/304;H01L21/3065;(IPC1-7):H01L21/306 主分类号 H05H1/46
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