发明名称 MODULAR SUBSTRATE MEASUREMENT SYSTEM
摘要 <p>A substrate measurement system including a measurement chamber and a substrate handling chamber possessing a substrate transfer and a substrate container interface arranged to receive a substrate to container. The handling chamber contains a first interface to connect the measurement chamber and the measurement chamber contains a second interface to connect the handling chamber. The transfer means is arranged to transfer substrates between the container and the measurement chamber through the handling chamber, in which system a second measurement chamber is provided, having the same second interface as the first measurement chamber to replace latter chamber.</p>
申请公布号 EP1273031(B1) 申请公布日期 2005.08.10
申请号 EP20010923985 申请日期 2001.04.12
申请人 NANOPHOTONICS AG;RECIF SA 发明人 ABRAHAM, MICHAEL;RAAIJMAKERS, IVO, J., M., M.;GAUDON, ALAIN;ASTEGNO, PIERRE
分类号 B65G1/00;H01L21/00;H01L21/02;H01L21/66;H01L21/67;H01L21/673;H01L21/677;H01L21/68;(IPC1-7):H01L21/00 主分类号 B65G1/00
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