首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
MEASURING TURBIDITIES BY REFLECTOMETRY
摘要
申请公布号
EP1183524(B1)
申请公布日期
2005.07.13
申请号
EP20000934982
申请日期
2000.05.04
申请人
MERCK PATENT GMBH
发明人
TANZER, DIETER
分类号
G01N21/47;G01N21/01;G01N21/51;(IPC1-7):G01N21/51;G01N21/49;G01N21/03
主分类号
G01N21/47
代理机构
代理人
主权项
地址
您可能感兴趣的专利
VIDEO SIGNAL CORRECTION CIRCUIT
ERROR INSPECTION DEVICE AND REPRODUCING APPARATUS EMPLOYING THE SAME
REPRODUCING TIME DISPLAY METHOD OF ENCODE DATA AND REPRODUCING APPARATUS USING SAME
IP CONVERSION PROCESSING APPARATUS, AND CONTROL METHOD THEREOF
IMAGE READING APPARATUS
METHOD OF MANUFACTURING LIQUID CRYSTAL DISPLAY
BUMP JOINING DEVICE AND METHOD, AND SEMICONDUCTOR COMPONENT MANUFACTURING DEVICE
SIDE SURFACE LIGHT-EMITTING SEMICONDUCTOR LASER DIODE IN WHICH DIELECTRIC LAYER IS FORMED ON ACTIVITY LAYER
METHOD FOR FORMING CONTACT HOLE OF SEMICONDUCTOR DEVICE
PROTRUSIVE ELECTRODE MANUFACTURING METHOD
HEAT SINK AND METHOD OF MANUFACTURING SAME
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
METHOD FOR MANUFACTURING VERTICAL BIPOLAR ELEMENT
REINFORCING PLATE WITH ADHESIVE AND FLEXIBLE PRINTED BOARD
SEMICONDUCTOR CIRCUIT AND ITS MANUFACTURING METHOD
REINFORCING PLATE WITH ADHESIVE AND FLEXIBLE PRINTED BOARD
SELECTING METHOD OF SILICON WAFER, AND MANUFACTURING METHOD OF ANNEALED WAFER
METHOD FOR FORMING SEMICONDUCTOR DEVICE
METHOD FOR INSPECTING SEMICONDUCTOR DEVICE
VOLUME DEVICE AND PORTABLE ELECTRONIC EQUIPMENT
