发明名称 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a wiring structure in which filling of a hole can be improved, and to enhance yield of semiconductor device. SOLUTION: The semiconductor device comprises a first layer having lower layer wiring 1 formed by filling a first groove with a conductive material, and a second layer formed on the first layer and having upper layer wiring 8 formed by filling a trench 3 extending down to a predetermined depth from the upper surface with a conductive material, a via 9 formed by filling a contact hole 4 extending down to the lower layer wiring 1 from the bottom face of the trench 3 with a conductive material, and a via 10 formed by filling an opening extending down to the lower layer wiring 1 from the upper surface with the conductive material. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005175195(A) 申请公布日期 2005.06.30
申请号 JP20030413060 申请日期 2003.12.11
申请人 SEMICONDUCTOR LEADING EDGE TECHNOLOGIES INC 发明人 TOYODA YOSHIHIKO
分类号 H01L23/52;H01L21/3205;H01L21/768;(IPC1-7):H01L21/320 主分类号 H01L23/52
代理机构 代理人
主权项
地址
您可能感兴趣的专利