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发明名称
Circuit for inspecting a data error
摘要
A circuit for inspecting a data error is described herein. The circuit for inspecting a data error comprises a clock buffer, a buffer unit, a latch unit, a decoder, a compression unit, a counter, a data bus signal latch unit, and a select unit.
申请公布号
US6912677(B2)
申请公布日期
2005.06.28
申请号
US20020294202
申请日期
2002.11.14
申请人
HYNIX SEMICONDUCTOR INC.
发明人
SONG DAE SIK
分类号
G06F11/00;G11C29/40;(IPC1-7):G11C29/00
主分类号
G06F11/00
代理机构
代理人
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