发明名称 PROJECTION EXPOSURE APPARATUS, STAGE APPARATUS, AND EXPOSURE METHOD
摘要 <p>A projection exposure apparatus (100) has a substrate table (30) on which a substrate (W) is placed and movable while holding the substrate, a position measuring system (18 and others) for measuring positional information of the substrate table, and a correcting apparatus (19) for correcting positional displacement occurring in at least either the substrate or the substrate table caused by supply of a liquid. The correcting apparatus corrects positional displacement occurring in at least either the substrate or the substrate table caused by supply of a liquid. By the structure above, a substrate is highly accurate exposed using a liquid immersion method.</p>
申请公布号 WO2005057635(A1) 申请公布日期 2005.06.23
申请号 WO2004JP18604 申请日期 2004.12.14
申请人 NIKON CORPORATION;KAYAMA, YASUNAGA;ARAI, DAI 发明人 KAYAMA, YASUNAGA;ARAI, DAI
分类号 G03F7/20;(IPC1-7):H01L21/027;G03F9/00 主分类号 G03F7/20
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