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发明名称
移除深沟渠结构中半球形晶粒矽层之方法
摘要
一种移除深沟渠结构中半球形晶粒矽之方法,其利用一埋藏矽锗层做为蚀刻终止层,并以湿蚀刻制程移除半球形晶粒矽。湿蚀刻制程所用之氢氧化钾/丙酮/水混合液对半球形晶粒矽与埋藏矽锗层的蚀刻速率选择性很高,因此在移除半球形晶粒矽时,不会破坏沟渠侧壁。此外,利用此法制得之沟渠式电容结构,在半球形晶粒矽层与沟渠下半部之间并没有蚀刻终止层,故无储存电容降低的问题。
申请公布号
TW200516696
申请公布日期
2005.05.16
申请号
TW092131135
申请日期
2003.11.06
申请人
茂德科技股份有限公司
发明人
巫勇贤
分类号
H01L21/76
主分类号
H01L21/76
代理机构
代理人
蔡坤财
主权项
地址
新竹市新竹科学工业园区力行路19号3楼
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