发明名称 |
STRUCTURE AND METHOD FOR ISOLATION OF SEMICONDUCTOR DEVICE |
摘要 |
An isolation structure of a semiconductor device and an isolation method thereof are provided to fill a gap of a trench without a void and prevent generation of grooves on a surface of an isolation layer by changing a vertical sidewall of a trench into an oblique sidewall. An active region and a trench(25) are formed on a semiconductor substrate(10). A plurality of elements are formed on the active region. The trench is used for isolating the elements from each other. A spacer(35) is formed at a sidewall of the trench. An insulating layer is formed in a gap of the trench. A liner insulating layer(31) is formed outside a spacer within the trench.
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申请公布号 |
KR20050031623(A) |
申请公布日期 |
2005.04.06 |
申请号 |
KR20030067829 |
申请日期 |
2003.09.30 |
申请人 |
DONGBUANAM SEMICONDUCTOR INC. |
发明人 |
KIM, KEE YONG |
分类号 |
H01L21/762;(IPC1-7):H01L21/762 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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