发明名称 STRUCTURE AND METHOD FOR ISOLATION OF SEMICONDUCTOR DEVICE
摘要 An isolation structure of a semiconductor device and an isolation method thereof are provided to fill a gap of a trench without a void and prevent generation of grooves on a surface of an isolation layer by changing a vertical sidewall of a trench into an oblique sidewall. An active region and a trench(25) are formed on a semiconductor substrate(10). A plurality of elements are formed on the active region. The trench is used for isolating the elements from each other. A spacer(35) is formed at a sidewall of the trench. An insulating layer is formed in a gap of the trench. A liner insulating layer(31) is formed outside a spacer within the trench.
申请公布号 KR20050031623(A) 申请公布日期 2005.04.06
申请号 KR20030067829 申请日期 2003.09.30
申请人 DONGBUANAM SEMICONDUCTOR INC. 发明人 KIM, KEE YONG
分类号 H01L21/762;(IPC1-7):H01L21/762 主分类号 H01L21/762
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