发明名称 Semiconductor channel on insulator structure
摘要 A method including forming a via dielectric layer on a semiconductor device substrate; forming a trench dielectric layer on the via dielectric layer; forming a trench through the trench dielectric layer to expose the via dielectric layer; forming a via in the via dielectric layer through the trench to expose the substrate; and forming a semiconductor material in the via and in the trench. An apparatus including a device substrate; a dielectric layer formed on a surface of the device substrate; and a device base formed on the dielectric layer including a crystalline structure derived from the device substrate.
申请公布号 US2005064616(A1) 申请公布日期 2005.03.24
申请号 US20030669064 申请日期 2003.09.23
申请人 JIN BEEN-YIH;DOYLE BRIAN S.;HARELAND SCOTT A.;DOCZY MARK L.;METZ MATTHEW V.;BOYANOV BOYAN I.;DATTA SUMAN;KAVALIEROS JACK T.;CHAU ROBERT S. 发明人 JIN BEEN-YIH;DOYLE BRIAN S.;HARELAND SCOTT A.;DOCZY MARK L.;METZ MATTHEW V.;BOYANOV BOYAN I.;DATTA SUMAN;KAVALIEROS JACK T.;CHAU ROBERT S.
分类号 H01L21/20;H01L21/336;H01L21/768;H01L29/786;(IPC1-7):H01L21/00;H01L21/84;H01L21/476 主分类号 H01L21/20
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