IMPROVED SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT,申请号EP20020777760-传众专利搜索

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发明名称	IMPROVED SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT
摘要
申请公布号	EP1476715(A1)	申请公布日期	2004.11.17
申请号	EP20020777760	申请日期	2002.10.16
申请人	NANO-OR TECHNOLOGIES (ISRAEL) LTD.	发明人	ARIELI, YOEL;WOLFLING, SHAY;BANITT, DAVID;WEITZMAN, YOSI;SABAN, YORAM;LANZMANN, EMMANUEL;LEVAVI, SHAY
分类号	G01B9/02;G11B7/005;G11B7/013;(IPC1-7):G01B9/02	主分类号	G01B9/02
代理机构		代理人
主权项
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